1 article(s) from Welker, Joachim

Analysis of force-deconvolution methods in frequency-modulation atomic force microscopy

  • Joachim Welker,
  • Esther Illek and
  • Franz J. Giessibl

Beilstein J. Nanotechnol. 2012, 3, 238–248, doi:10.3762/bjnano.3.27

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Published 14 Mar 2012
 
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